A polishing process of silicon wafers
Inspection before polishing
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Inspection before polishing
- Measurement of thickness
- Batch formation
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Mounting
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Mounting
- Coated wax on reverse of wafers
- Mounted wafers on the polishing plate
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1 st polishing
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1 st polishing
- High efficiency
- Make into mirror surfaces
- Removal of surface damage
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2 nd polishing
Final polishing
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2 nd polishing
- OSF free
- Improvement of surface roughnessi1-3nmRyj
Final polishing
- Haze free
- Removal of surface contamination
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Cleaning
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Cleaning
- Removal of particle, organic, inorganic substance
and heavy metal contamination
Cleaning method :
- Alkaline solution
- Acid solution
- Ultra-pure water
Drying method :
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Inspection
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Inspection
- Dark field of vision in the clean room, The
use of halogen lighting
Surface inspection :
- Micro-scratch
- Haze
- Particle
- etc.
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Measurement
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Measurement :
- Thickness
- Flatness
- PN
- Resistance
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