A polishing process of silicon wafers

Inspection before polishing

Inspection before polishing

  • Measurement of thickness
  • Batch formation

Mounting

Mounting

  • Coated wax on reverse of wafers
  • Mounted wafers on the polishing plate

1 st polishing

1 st polishing

  • High efficiency
  • Make into mirror surfaces
  • Removal of surface damage

2 nd polishing
Final polishing

2 nd polishing

  • OSF free
  • Improvement of surface roughnessi1-3nmRyj

Final polishing

  • Haze free
  • Removal of surface contamination

Cleaning

Cleaning

  • Removal of particle, organic, inorganic substance and heavy metal contamination

Cleaning method :

    • Alkaline solution
    • Acid solution
    • Ultra-pure water

Drying method :

    • Spin Dryer
    • Vapor Dryer

Inspection

Inspection

  • Dark field of vision in the clean room, The use of halogen lighting

Surface inspection :

    • Micro-scratch
    • Haze
    • Particle
    • etc.

Measurement

Measurement :

  • Thickness
  • Flatness
  • PN
  • Resistance

Non Frame Top / Frame Top